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Interface state generation induced by Fowler-Nordheim tunneling in mos devices /

Thesis (M. Phil.)--University of Hong Kong, 1999. / Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51346475
Date January 1999
CreatorsLi, Stella.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract.

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