Return to search

Gate oxide integrity for deep submicron CMOS device/circuit reliability

No description available.

1. https://stars.library.ucf.edu/rtd/1417

Identifer	oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-2416
Date	01 April 2001
Creators	Zhang, Jinlong
Publisher	STARS
Source Sets	University of Central Florida
Language	English
Detected Language	English
Type	text
Source	Retrospective Theses and Dissertations