On-wafer S-parameter measurement using four-port technique and intermodulation linearity of RF CMOS

Description

Thesis (Ph. D.)--Auburn University. / Abstract. Vita. Includes bibliographical references (p. 160-167).

Links & Downloads

1. http://hdl.handle.net/10415/1448

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/320968982
Date	January 2008
Creators	Wei, Xiaoyun, Niu, Guofu,
Publisher	Auburn, Ala.,
Source Sets	OCLC
Language	English
Detected Language	English