This work discusses a methodology developed for robust RF test structure design for SiGe HBTs operating at mm-wave frequencies.
| Identifer | oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/42922 |
| Date | 18 November 2011 |
| Creators | Mills, Richard P., III |
| Publisher | Georgia Institute of Technology |
| Source Sets | Georgia Tech Electronic Thesis and Dissertation Archive |
| Detected Language | English |
| Type | Thesis |
Page generated in 0.0013 seconds