Hot-carrier reliability simulation in aggresively scaled MOS transistors

Description

Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, 2003. / Title from PDF title screen. Includes bibliographical references.

Links & Downloads

1. http://etd.library.vanderbilt.edu/ETD-db/available/etd-12032003-100902/

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/53886998
Date	January 2003
Creators	Pagey, Manish Prabhakar.
Source Sets	OCLC
Language	English
Detected Language	English