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The effects of oxide traps on the surface photovoltage in metal-oxide-semiconductor structures.

H.Y. Tsoi. / Thesis (M.Phil.)--Chinese University of Hong Kong. / Bibliography: leaf [3]

Identiferoai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_320867
Date January 1974
ContributorsTsoi, H. Y., Chinese University of Hong Kong Graduate School. Division of Electronics.
PublisherChinese University of Hong Kong
Source SetsThe Chinese University of Hong Kong
LanguageEnglish
Detected LanguageEnglish
TypeText, bibliography
Formatprint, 1 v. (various pagings) : ill. ; 28 cm.
RightsUse of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/)

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