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Study of semiconductor and metal surfaces using a novel scanning Kelvin probe

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:327111
Date January 2000
CreatorsPetermann, Uwe
PublisherRobert Gordon University
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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