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Vanadium Oxide (vox) Thin Films Elaborated By Sol-gel Method For Microbolometer Applications

Infrared detector technologies have been developing each day. Thermal detectors take great attention in commercial applications due to their low power consumption and low costs. The active material selection and the deposition of the material are highly important performance effective factors for microbolometer detector applications. In that sense, developing vanadium oxide (VOx) microbolometer active material by sol-gel method might be feasible approach to achieve good performance microbolometer detectors.
In this study, vanadium oxide thin films are prepared by sol-gel method is deposited on silicon or silicon nitride wafers as active material by spin coating. The films are annealed under different hydrogen concentration of H2/N2 environments at 410

Identiferoai:union.ndltd.org:METU/oai:etd.lib.metu.edu.tr:http://etd.lib.metu.edu.tr/upload/12614078/index.pdf
Date01 January 2012
CreatorsKarsli, Kadir
ContributorsAkin, Tayfun
PublisherMETU
Source SetsMiddle East Technical Univ.
LanguageEnglish
Detected LanguageEnglish
TypeM.S. Thesis
Formattext/pdf
RightsTo liberate the content for public access

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