Return to search

Self test and self repair strategies in VLSI architectures for high speed digital correlation

No description available.

1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370905

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:370905
Date	January 1985
Creators	Blackley, William Sinclair
Publisher	University of Edinburgh
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation
Source	http://hdl.handle.net/1842/14106