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Temperature dependent mechanical behavior of silicon dioxide, gold and gold-vanadium thin films for VLSI integrated circuits and MicroElectroMechanical systems (MEMs) /

Thesis (Ph. D.)--Lehigh University, 2004. / Includes vita. Includes bibliographical references (leaves 256-263).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56404015
Date January 2003
CreatorsLin, Ming-Tzer,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeAcademic dissertations

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