Developing alternating current scanning tunneling microscopy and atomic force microscopy to measure thin film properties on the nanoscale /

Description

Thesis (Ph. D.)--University of Washington, 2000. / Vita. Includes bibliographical references (leaves 239-244).

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1. http://hdl.handle.net/1773/8515

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/46870635
Date	January 2000
Creators	Szuchmacher, Amy L.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Theses
Source	Connect to this title online; UW restricted