The aim of this work is to introduce the principle of scanning in optical microscopy. This thesis deals with problem of parameters of display process and their influence on the results and measurements of these parameters. In detail there is analyzed the depth of field of the optical system and there are established some possibilities of theoretical and experimental determination. Part of this thesis is the realization of the measurement work place and program providing experimental depth of field based on different measurement methods. The conclusion is devoted to the practical part, which has the task to monitor settings and optical systems and their impact on depth of field.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:220030 |
| Date | January 2013 |
| Creators | Kubáček, Svatopluk |
| Contributors | Čmiel, Vratislav, Odstrčilík, Jan |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0014 seconds