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Neural network-based MC X-ray for quantitative analysis of elements

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:n583z1432
Date January 2023
CreatorsGao, Dawei
ContributorsRaynald Gauvin (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.

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