A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values /

Description

University, Diss., 2002--Kassel. / Lizenzpflichtig.

Links & Downloads

1. http://www.upress.uni-kassel.de/abstracts_fr/3-933146-94-1.html
2. http://deposit.d-nb.de/cgi-bin/dokserv?idn=969573847

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/175020138
Date	January 2002
Creators	Mwema, Wilfred N.
Publisher	Kassel : Kassel Univ. Press,
Source Sets	OCLC
Language	English
Detected Language	English