The materials based on GaN have successfully developed on short-wavelength laser diodes (LDs), light-emitting diodes (LEDs) and ultraviolet photodetector. In this study, GaN epitaxial layers have been successfully grown on sapphire substrates. We used several methods including the pre-baking treatment for sapphire substrates before growing epilayer, the growth temperature of buffer layer and the growth temperature of GaN epilayer to study it. From the results of the photoluminescence (PL) measured at 77K, the X-Ray diffraction measurement, SEM cross sectional views to realize the characteristic and we get a better qualities of GaN epilayers after using the foregoing methods. In this study, the pre-baking treatment for sapphire substrates can influence the quality and morphology of GaN epilayers. According to the results of the experiments, we study the mechanisms of yellows luminescence and donor-acceptor pair (DAP).
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0711102-114708 |
| Date | 11 July 2002 |
| Creators | Lin, Yen-Liang |
| Contributors | none, none, Ming-Kwei Lee, none |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0711102-114708 |
| Rights | not_available, Copyright information available at source archive |
Page generated in 0.0019 seconds