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Charge State Distributions in Molecular Dissociation

The present work provides charge state fractions that may be used to generate TEAMS relative sensitivity factors for impurities in semiconductor materials.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc278340
Date12 1900
CreatorsRenfrow, Steven N. (Steven Neal)
ContributorsMcDaniel, Floyd Del. (Floyd Delbert), 1942-, Duggan, Jerome L., Weathers, Duncan L.
PublisherUniversity of North Texas
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formatv, 84 leaves : ill., Text
RightsPublic, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Renfrow, Steven N. (Steven Neal)

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