Microstructural investigation of defects in epitaxial GaAs grown on mismatched Ge and SiGe/Si substrates

Description

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xxii, 212 p.; also includes graphics. Includes bibliographical references (p. 203-212). Available online via OhioLINK's ETD Center

Links & Downloads

1. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1116498970

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/62093534
Date	January 2005
Creators	Boeckl John J.,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to this title online