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A fault detection and diagnosis technique for multi-chip module interconnects

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/13736
Date05 1900
CreatorsKim, Bruce Chang-Shik
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Languageen_US
Detected LanguageFrench
TypeDissertation
Format236 bytes, text/html
RightsAccess restricted to authorized Georgia Tech users only.

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