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A Study of the Effects of Neutron Irradiation and Low Temperature Annealing on the Electrical Properties of 4H Silicon Carbide

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1211898142
Date15 October 2008
CreatorsStone, Stephen E.
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1211898142
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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