Return to search

Characterization of boron nitride thin films on silicon (100) wafers

Thesis (M.S.)--University of North Texas, Aug., 2007. / Title from title page display. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/191488109
Date January 2007
CreatorsMaranon, Walter. Nasrazadani, Seifollah,
Publisher[Denton, Tex.] : University of North Texas,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Sourceconnect to online resource.

Page generated in 0.0058 seconds