Return to search

Measurement Techniques for Noise Figure and Gain of Bipolar Transistors

First, the concepts of reflection coefficients, s-parameters, Smith chart, noise figure, and available power gain will be introduced. This lays out the foundation for the presentation of techniques on measuring noise figure and gain of high speed bipolar junction transistors. Noise sources in a bipolar junction transistor and an equivalent circuit including these noise sources will be presented. The process of determining the noise parameters of a transistor will also be discussed. A Pascal program and several TEKSPICE scripts are developed to calculate the stability, available power gain, and noise figure circles. Finally, these circles are plotted on a Smith chart to give a clear view of how a transistor will perform due to a change in source impedances.

Identiferoai:union.ndltd.org:pdx.edu/oai:pdxscholar.library.pdx.edu:open_access_etds-5663
Date02 June 1993
CreatorsJung, Wayne Kan
PublisherPDXScholar
Source SetsPortland State University
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceDissertations and Theses

Page generated in 0.0021 seconds