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Development of a non-destructive optical method to measure residual stress in thin rectangular samples employing digital image processing

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Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/20645
Date05 1900
CreatorsAllard, Christopher E.
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis
RightsAccess restricted to authorized Georgia Tech users only.

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