Return to search

Quantitative in-situ particle characterization using focused beam reflectance measurements

Zugl.: Aachen, Techn. Hochsch., Diss.

  1. http://d-nb.info/993097561/04
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/423758964
Date January 2009
CreatorsKail, Norbert
PublisherDüsseldorf VDI-Verl.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0018 seconds