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Hot carrier induced degradation and gamma radiation induced degradation in SiGe HBTs and VCOs /

Thesis (M. App. Sc.)--Carleton University, 2004. / Includes bibliographical references (p. 72-75). Also available in electronic format on the Internet.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/290649556
Date January 1900
CreatorsGill, Coralie R.
PublisherOttawa,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceProQuest Full Text

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