Double sampling procedure is adapted from a statistical branch called acceptance sampling. The first Shewhart-type double sampling monitoring scheme was introduced in the statistical process monitoring (SPM) field in 1974. The double sampling monitoring scheme has been proven to effectively decrease the sampling effort and, at the same time, to decrease the time to detect potential out-of-control situations when monitoring the location, variability, joint location and variability using univariate or multivariate techniques. Consequently, an overview is conducted to give a full account of all 76 publications on double sampling monitoring schemes that exist in the SPM literature. Moreover, in the review conducted here, these are categorized and summarized so that any research gaps in the SPM literature can easily be identified. Next, based on the knowledge gained from the literature review about the existing designs for monitoring the process mean, a new type of double sampling design is proposed. The new charting region design lead to a class of a control charts called a side-sensitive double sampling (SSDS) monitoring schemes. In this study, the SSDS scheme is implemented to monitor the process mean when the underlying process parameters are known as well as when they are unknown. A variety of run-length properties (i.e., the 5th, 25th, 50th, 75th, 95th percentiles, the average run-length (π΄π πΏ), standard deviation of the run-length (ππ·π πΏ), the average sample size (π΄ππ) and the average extra quadratic loss (π΄πΈππΏ) metrics) are used to design and implement the new SSDS scheme. Comparisons with other established monitoring schemes (when parameters are known and unknown) indicate that the proposed SSDS scheme has a better overall performance. Illustrative examples are also given to facilitate the real-life implementation of the proposed SSDS schemes. Finally, a list of possible future research ideas is given with hope that this will stimulate more future research on simple as well as complex double sampling schemes (especially using the newly proposed SSDS design) for monitoring a variety of quality characteristics in the future. / Statistics / M. Sc. (Statistics)
Identifer | oai:union.ndltd.org:netd.ac.za/oai:union.ndltd.org:unisa/oai:uir.unisa.ac.za:10500/27404 |
Date | 06 1900 |
Creators | Motsepa, Collen Mabilubilu |
Contributors | Malela, M. J. C. |
Source Sets | South African National ETD Portal |
Language | English |
Detected Language | English |
Type | Dissertation |
Format | 1 online resource (ix, 119 leaves) : color illustrations, color graphs, application/pdf |
Page generated in 0.0034 seconds