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Interfacial properties of thin film hetero-structure copper-oxides of hafnium-silicon /

Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56840681
Date January 2002
CreatorsPark, Hyun Jung.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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