Electrical characterization of Si-SiO2 interface for thin oxides /

Description

Thesis (Ph. D.)--University of Hong Kong, 1987.

Links & Downloads

1. http://sunzi.lib.hku.hk/hkuto/record.jsp?B12232580

Tags

Silicon Silicon oxide films.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/52010857
Date	January 1987
Creators	Hung, Kwok-kwong.
Publisher	[Hong Kong : University of Hong Kong],
Source Sets	OCLC
Language	English
Detected Language	English
Source	View the Table of Contents & Abstract.