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Study of reliability mechanisms and their interaction in nanoscale CMOSFETs

Thesis (Ph.D.)--George Mason University, 2008. / Vita: p. 121. Thesis director: Dimitris E. Ioannou. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Jan. 11, 2009). Includes bibliographical references (p. 111-120). Also issued in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/298725788
Date January 2008
CreatorsMishra, Rahul,
PublisherFairfax, VA : George Mason University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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