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Capacitance-voltage spectroscopy in metal-tantalum pentoxide (Ta-O)-silicon mos capacitors/

Thesis (Master)--İzmir Institute of Technology, İzmir, 2005 / Keywords: Capacitance-voltage spectroscopy, high dielectric constant insulators, tantalum pentoxide. Includes bibliographical references (leaves 92-97)

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/416456938
Date January 2005
CreatorsÖzdağ, Pınar. Güneş, Mehmet
Publisher[s.l.]: [s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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