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Hierarchical test generation for CMOS circuits /

Thesis (Ph. D.)--Virginia Polytechnic Institute and State University, 1992. / Vita. Abstract. Includes bibliographical references (leaves 160-168). Also available via the Internet.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/26091172
Date January 1992
CreatorsBollinger, S. Wayne,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceThis resource online

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