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Low temperature force microscopy on a deeply embedded two dimensional electron gas

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:fq977v18m
Date January 2011
CreatorsHedberg, James
ContributorsGuillaume Gervais (Internal/Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 97016

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