Structural and electrical characterization of highly oriented (KxNax)NbO3 (KNN) thin films by chemical solution deposition

Description

Thesis--Auburn University, 2009. / Abstract. Vita. Includes bibliographical references (p. 77-82).

Links & Downloads

1. http://hdl.handle.net/10415/1604

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/325042755
Date	January 2009
Creators	Kang, Chiwon, Kim, Dong Joo,
Publisher	Auburn, Ala.,
Source Sets	OCLC
Language	English
Detected Language	English