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Noise reduction in THZ-TDS dielectric characterization of thin films with THZ interferometry

Thesis (M. S.)--Oklahoma State University, 2004. / Vita. Includes bibliographical references (p. 49-52).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/60683548
Date January 2004
CreatorsSmall, Jay A.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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