Semiconductor materials used for making photovoltaic (PV) cells have defects and impurities due to constraints of keeping production costs low. Electrically active defects that are distributed over the bulk material lead to reduced overall performance of a photovoltaic (PV) cell. In this study an adaptable Light Beam Induced Current (LBIC) system was designed in order to characterize the local performance of PV cells. The system uses a laser source and objective lens mounted vertically above the sample on the X-Y stage. Two current pre-amplifiers are used for converting the photo-generated current from the PV cell and the signal from the reflection detector cell into a voltage that can be measured by the data acquisition board. Two configurations for measuring the photo-current maps of either bare cells or encapsulated PV mini-modules can be used. To add flexibility it was envisaged that the system would be built in such a way that it allows easy integration of carrier lifetime mapping capabilities while keeping costs to a minimum. The carrier lifetime measurement technique integrated into the LBIC system is based on the optical Open-Circuit Voltage-Decay (OCVD) method. In a single-crystalline silicon PV cell that was tested, photo-current and opencircuit voltage LBIC scans revealed shunting behaviour due to scratch marks on the front surface. The marks are believed to have been caused by poor handling during manufacturing process. Reduced photo-current due to edge shunting was observed towards the edges of the PV cell. In another sample of single crystalline silicon cell an edge shunt resulted in a 30 percent drop in photo-current measured. LBIC measurements performed on multi-crystalline cells revealed nonuniformities such as enhanced photo-current on one side of grain boundaries. These asymmetric enhancements of local photo-current are attributed to the incline of the grain boundary into the bulk of the material. LBIC results obtained from mini modules showed a high degree of mismatching from cell to cell. It is well known that mismatching can degrade the performance of a PV module with series connected cells. The LBIC measurements presented also illustrated the negative effects of delamination on the photo-current of PV modules. The LBIC measurements performed on mini PV modules highlight some of the benefits of using an LBIC technique as a tool for investigating PV cell’s local photo-current response. The effective lifetime maps obtained highlight the importance of optical OCVD method as a tool that can be used in conjunction with conventional LBIC technique. Effective minority carrier lifetimes around 40 ms were measured on a single crystalline silicon cell of 2.5 x 2.5 cm2. Local features such as cracks and lifetime degrading defects were revealed by LBIC maps and were also confirmed on effective lifetime maps. The results presented demonstrate the importance of using effective carrier lifetime maps to complement photocurrent maps of PV cells and identification of areas where defects are located.
| Identifer | oai:union.ndltd.org:netd.ac.za/oai:union.ndltd.org:nmmu/vital:10529 |
| Date | January 2008 |
| Creators | Gxasheka, Andile Richman |
| Publisher | Nelson Mandela Metropolitan University, Faculty of Science |
| Source Sets | South African National ETD Portal |
| Language | English |
| Detected Language | English |
| Type | Thesis, Doctoral, PhD |
| Format | 92 pages, pdf |
| Rights | Nelson Mandela Metropolitan University |
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