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Analog and mixed-signal test methods using on-chip embedded test cores

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:7w62f998d
Date January 2002
CreatorsHafed, Mohamed M.
ContributorsRoberts, Gordon W. (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationProquest: NQ85710, Pid: 38487

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