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X-ray techniques for probing self-assembled monolayer structures

We investigated the feasibility of using X-rays to study self-assembled monolayers on inorganic surfaces. Variable-temperature X-ray powder diffraction measurements of metal alkylphosphonate salts measured the contraction and expansion of planar inorganic layers as the material passed through a series of phase transitions when heated and cooled. Small-angle X-ray scattering measurements of alkanethiolate-capped gold nanoclusters allowed the determination of the average nanocluster size and the average distance between nanoclusters. These techniques have been demonstrated to contribute useful information which, when combined with results from other probes, lead to a detailed model of the materials' structures and properties.

Identiferoai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.20244
Date January 1997
CreatorsBorthwick, Matthew A.
ContributorsSutton, Mark (advisor)
PublisherMcGill University
Source SetsLibrary and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada
LanguageEnglish
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Formatapplication/pdf
CoverageMaster of Science (Department of Physics.)
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
Relationalephsysno: 001609571, proquestno: MQ44129, Theses scanned by UMI/ProQuest.

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