Measuring the electronic structure of atomically uniform Ag films grown on Si using angle-resolved photoemission spectroscopy /

Description

Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008. / Source: Dissertation Abstracts International, Volume: 69-11, Section: B, page: 6873. Adviser: Tai Chiang. Includes bibliographical references. Available on microfilm from Pro Quest Information and Learning.

Links & Downloads

1. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:3337905

Tags

Physics, Condensed Matter.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/434042250
Date	January 2008
Creators	Speer, Nathan James,
Source Sets	OCLC
Language	English
Detected Language	English