The elastic properties of a material have long been a subject of interest in materials science and physics. Especially, a complete determination of the single crystal compliance and stiffness tensor is of great importance, as the single crystal elastic tensor provides a complete description of the elastic properties of a material. There are numerous materials that are only available in polycrystalline form. Many of these polycrystalline materials are of great interest, such as the polycrystalline materials synthesized under high pressure conditions, for which the elastic properties under high pressure conditions are particularly important. However, traditional methods to measure the elastic constants apply only to single crystals. Recently, Singh and co-workers have developed a method, using energy dispersive X-ray diffraction to measure the single crystal elastic constants of a material at elevated pressures, which, for the first time, enabled the single crystal elastic tensors of numerous polycrystalline samples to be determined. Inspired by the energy dispersive X-ray diffraction method, we have undertaken to develop a novel method, using angle dispersive X-ray diffraction techniques combined with a two-dimensional X-ray recording area detector, to measure the single crystal elastic constants of powder samples. We have obtained important results that will enable the single crystal elastic constants of concerned material to be determined from Debye rings recorded on the X-ray recording image plate. In comparison to the energy dispersive X-ray diffraction method, the angle dispersive X-ray diffraction method offers advantages, as we will demonstrate.
| Identifer | oai:union.ndltd.org:uottawa.ca/oai:ruor.uottawa.ca:10393/6338 |
| Date | January 2002 |
| Creators | Hou, Weimin. |
| Contributors | Desgreniers, Serge, |
| Publisher | University of Ottawa (Canada) |
| Source Sets | Université d’Ottawa |
| Detected Language | English |
| Type | Thesis |
| Format | 91 p. |
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