The number of Frenkel pairs produced per ion (N(,FP)) was measured at 5K for various heavy ion irradiations of thin chromium films. Values much lower than those predicted by transport theory were found. The divergence of experiment and theory was correlated with the maximum elastic deposited energy density ((THETA)(,M)) and the average concentration of Frenkel pairs (C(,FP)). Subthreshold recombination is the only mechanism that can explain why N(,FP)(Exp) was less than unity for several of the irradiations. / For a given ion mass the rate at which the damage annealed out of the chromium films dependent on the irradiation energy. The difference between the annealing rates of 20 and 100 keV ion induced damage was most prominent for the heavier masses (I+,Br+). The presence of unannealed damage at 80K suggest that at least some clustering of defects did occur. / For the 20-50 keV/atom range N+ and N(,2)+ ions of equal velocities had the same defect production rate. No difference in the annealing rates of the damage from these two beams was detected. It is speculated, however, that a higher mass atom would have different damage rates (per atom) associated with its monomer and dimer ions of equal velocity. / Source: Dissertation Abstracts International, Volume: 47-05, Section: B, page: 2045. / Thesis (Ph.D.)--The Florida State University, 1986.
| Identifer | oai:union.ndltd.org:fsu.edu/oai:fsu.digital.flvc.org:fsu_75826 |
| Contributors | GRAHAM, JOHN ROBERT., Florida State University |
| Source Sets | Florida State University |
| Detected Language | English |
| Type | Text |
| Format | 214 p. |
| Rights | On campus use only. |
| Relation | Dissertation Abstracts International |
Page generated in 0.0021 seconds