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Measuring diffuse x-ray reflectivity from rough interfaces

No description available.
Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:ks65hf19g
Date January 1996
CreatorsHao, Biao.
ContributorsSutton, Mark (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 24010, Proquest: MM19819

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