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Investigation of tapping-mode scanning near-field optical microscope

A crucial part of the Scanning Near-Field Microscope (SNOM) is the distance regulation that keeps the separation of a fiber probe tip and the sample surface constant. Previously, shear-force detection was implemented. Shear-force interactions have the disadvantage of being destructive on soft sample. The implementation of an alternative tapping-mode is investigated in this thesis. In tapping-mode, the fiber tip oscillates perpendicularly to the sample surface, thus avoiding the destructive lateral shear-force. / This thesis also provides a general overview of SNOM, including the theory of near-field, the definition of spatial resolution, as well as the tip-sample distance regulation. Tapping-mode feedback is implemented and discussed in comparison to traditional shear-force feedback. Both CD stamper and Polystyrene images were obtained by using tapping-mode SNOM, and compared to images taken under shear-force mode SNOM and Scanning Electron Microscope. Different factors, which affect the performance of tapping-mode SNOM are discussed.

Identiferoai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.33777
Date January 2001
CreatorsHuang, Yi-ting, 1976-
ContributorsGruetter, Peter (advisor)
PublisherMcGill University
Source SetsLibrary and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada
LanguageEnglish
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Formatapplication/pdf
CoverageMaster of Science (Department of Physics.)
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
Relationalephsysno: 001871506, proquestno: MQ78894, Theses scanned by UMI/ProQuest.

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