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«In situ» study of amorphous semiconductor crystallization by dynamic transmission electron microscopy

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:b5644s034
Date January 2010
CreatorsMcGowan, Shona
ContributorsBradley Siwick (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 86999

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