Development of a novel method for measuring the transverse piezoelectric coefficients of thin piezoelectric films

Description

Thesis (M.S. in Materials Science and Engineering)--Washington State University. / Includes bibliographical references.

Links & Downloads

1. http://www.dissertations.wsu.edu/Thesis/Summer2004/t%5Fsullivan%5F072604.pdf

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56430306
Date	January 2004
Creators	Sullivan, Timothy Michael,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Online access for everyone