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Development of a novel method for measuring the transverse piezoelectric coefficients of thin piezoelectric films

Thesis (M.S. in Materials Science and Engineering)--Washington State University. / Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56430306
Date January 2004
CreatorsSullivan, Timothy Michael,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceOnline access for everyone

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