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FINITE ELEMENT ANALYSIS AND EXPERIMENTAL VERIFICATION OF SOI WAVEGUIDE LOSSES

Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the curved waveguide to an equivalent straight waveguide. Finite-element analysis with perfectly matched layer boundaries was used to solve the vector wave equation. Transmission loss was experimentally measured as a function of bend radius for several SOI waveguides. Good agreement was found between simulated and measured losses, and this technique was confirmed as a good predictor for loss and for minimum bend radius for efficient design.

Identiferoai:union.ndltd.org:uky.edu/oai:uknowledge.uky.edu:gradschool_theses-1488
Date01 January 2007
CreatorsSrinivasan, Harish
PublisherUKnowledge
Source SetsUniversity of Kentucky
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceUniversity of Kentucky Master's Theses

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