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Post-silicon Validation of Radiation Hardened Microprocessor, Embedded Flash and Test Structures

abstract: Digital systems are essential to the technological advancements in space exploration. Microprocessor and flash memory are the essential parts of such a digital system. Space exploration requires a special class of radiation hardened microprocessors and flash memories, which are not functionally disrupted in the presence of radiation. The reference design ‘HERMES’ is a radiation-hardened microprocessor with performance comparable to commercially available designs. The reference design ‘eFlash’ is a prototype of soft-error hardened flash memory for configuring Xilinx FPGAs. These designs are manufactured using a foundry bulk CMOS 90-nm low standby power (LP) process. This thesis presents the post-silicon validation results of these designs. / Dissertation/Thesis / Masters Thesis Electrical Engineering 2016

Identiferoai:union.ndltd.org:asu.edu/item:38487
Date January 2016
ContributorsGogulamudi, Anudeep Reddy (Author), Clark, Lawrence T (Advisor), Holbert, Keith E (Committee member), Brunhaver, John (Committee member), Arizona State University (Publisher)
Source SetsArizona State University
LanguageEnglish
Detected LanguageEnglish
TypeMasters Thesis
Format75 pages
Rightshttp://rightsstatements.org/vocab/InC/1.0/, All Rights Reserved

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