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The Total Quality Approach to Transistor Testing and Device Allocation

The purpose of this study is to design a transistor conversion system oriented toward quality categories rather than toward devices. Underlying this purpose are two working hypotheses: First, quality categories can be developed by capitalizing on transistor total quality and convertibility; second, a transistor conversion system oriented toward quality categories is superior to existing device-oriented methods.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc278508
Date05 1900
CreatorsNovak, Jarry Vaclav
ContributorsHays, Henry, Abernathy, Lewis M., Fitch, David Robnett, Copeland, Benny R., 1936-
PublisherNorth Texas State University
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Format4, viii, 226 leaves : ill., Text
RightsPublic, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Novak, Jarry Vaclav

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