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Scan path design of PLA to improve its testability in VLSI realization

Thesis (M.S.)--Ohio University, August, 1986. / Title from PDF t.p.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/227801157
Date January 1986
CreatorsChiang, Kang-Chung.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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