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Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and x-ray photoelectron spectroscopy (XPS) to study interactions of genetically engineered proteins with noble metal films /

Thesis (Ph. D.)--University of Washington, 2006. / Vita. Includes bibliographical references (leaves 132-140).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/85811202
Date January 2006
CreatorsSuzuki, Noriaki,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeTheses
SourceConnect to this title online; UW restricted

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