Time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of conformation and orientation of adsorbed protein films /

Description

Thesis (Ph. D.)--University of Washington, 2003. / Vita. Includes bibliographical references (leaves 164-178).

Links & Downloads

1. http://hdl.handle.net/1773/9869

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/54368290
Date	January 2003
Creators	Xia, Nan.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Theses
Source	Connect to this title online; UW restricted